Axio Vert.A1 inverted metallograph enables examinations of large, heavy samples, using a wide range of classic and advanced contrast methods. Switch easily between brightfield, darkfield, DIC, C-DIC, fluorescence and polarization contrast.
The 5x encoded nose-piece turret allows easy selection of the appropriate magnification and recognizes a change of objectives automatically. It also enables the use of a light manager to save and recover light intensity values. Use reticles and structure comparison disks for measuring and counting.
Powerful software analysis includes modules for grain size, phase analysis, layer thickness and interactive measurements for your investigations.
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