Description

Westmont, IL -- The newest version of the JEOL Benchtop Scanning Electron Microscope (SEM), the JCM-6000 NeoScope (NeoScope II), is now available through McCrone Microscopes & Accessories (MMA).

McCrone Microscopes & Accessories has launched a website at www.benchtopsem.com dedicated to the new NeoScope. Visitors to the website will find videos, images, and information explaining the key features and benefits of the NeoScope II. Website visitors may also initiate a request to have a technical expert come to their lab to give a free demonstration, or arrange for an online demonstration.

“The NeoScope II’s microanalytical capabilities, coupled with the highest benchtop magnification and resolution on the market, gives companies the ability to perform in-house SEM analysis,” said Jeff McGinn, president of McCrone Microscopes & Accessories.

With a magnification range up to 60,000X, redesigned touchscreen software controls, and an optional Energy Dispersive X-Ray Spectroscopy (EDS) feature for elemental identification, the NeoScope II will help materials analysis, geological, forensics and pharmaceutical scientists accelerate their research.

The NeoScope II is particularly useful as a high-throughput failure analysis tool due to its ability to image defects, surface blemishes and foreign materials.
The NeoScope II has also been tailored for its operator’s convenience. It has a space-saving design, offers quick loading, simple push-button imaging, and allows for easy downloading of images in a variety of formats.

McCrone Microscopes & Accessories offers a full line of SEM accessories for the NeoScope II, and provides on-site training and service contracts for the instrument.