Description

The Woodlands, TX –June 4, 2013. The new D/teX Ultra 250 silicon strip detector from Rigaku reduces data acquisition time by almost 50% compared to competitive detectors. The timesaving is achieved by increasing the active area of the aperture, which increases the overall count rate and has the added benefit of increasing the angular coverage of the detector. Extremely good energy resolution, or X-ray fluorescence (XRF) suppression, is achieved through a unique combination of low-energy discrimination and a secondary monochromator.

Rigaku Corporation introduces the D/teX Ultra 250 1D detector as part of an ongoing effort to reduce the time of X-ray diffraction (XRD) data acquisition, thus improving instrument throughput and the ROI associated with the acquisition of an instrument. The new silicon strip detector is available for use with Rigaku’s top of the line Smartlab diffractometer, a system noted for its innovative Guidance software, automated alignment, and CBO optics.

The D/teX Ultra 250 has a number of improvements over the previous model including a smaller pixel pitch (0.075 mm versus 0.10 mm) for improved resolution, an increased length for improved count rate and angular coverage, and a unique XRF suppression configuration that gives outstanding energy resolution.